Electrical Characterization can be used to determine resistivity, carrier concentration, mobility, contact resistance, barrier height, depletion width, oxide charge, interface states, carrier lifetimes, and deep level impurities.
The Electrical Characterization Group uses the Keithley 4200 Characterization Unit and nanoprobe holder installed on anti-vibration table and housed in a EM protected chamber. The system is equipped with four SMUs and can be used to conduct measurements like Two-Point Probe, Four-Point Probe, Differential Hall Effect, Capacitance-Voltage Profiling, DLTS, Electron beam-induced current, and DLCP.